SuperView WT3000 Hybrid 3D Optical Profilometer

Description

The Hybrid 3D optical profilometer Superview WT series is used for sub nanometer measurement of surfaces of various precision components and materials. It integrates the performance characteristics of two high-precision 3D measuring instruments, white light interferometer and confocal microscope, and can perform non-contact scanning of the samples surface then re-establish 3D surface image. When measuring the ultra smooth and transparent surfaces, white light interferometry mode can be used to obtain high-precision and distortion-free images, and analyze parameters such as roughness. When measuring coarse surfaces with sharp angle features, confocal microscopy mode can reconstruct large angle 3D topography images, and 2D & 3D parameters reflecting surface quality are obtained by data processing and analysis of surface 3D images through software.

 

details

  Parameters 

Adding W-Ultra high-speed scanning module can increase scanning speed by several times.

Model No. SuperView WT3000 SuperView WT3200
Light Source White Light LED
Video System 1024x1024
Interference Objective Lens 10X (2.5X, 5X, 20X, 100X optional)
Confocal Objective Lenses 10X, 50X(5X, 20X, 100X optional)
Standard Field of View 1.2x1.2mm (10x)
Lens Turret Motorized 5-hole turret
XY Object Table Size 200×200mm 300×300mm
Travel Range 100×100mm 200×200mm
Load Capacity 10kg
Control Mode Motorized
Tilt ±3°
Z - axis Travel Range 100mm
Control Mode Motorized
Z Stroke Scanning Range 10mm
Surface Topography Repeatability STR*1 0.1nm (White light interferometry)
Roughness RMS Repeatability*2 0.005nm (White light interferometry)
Step Height Measurement*3 Accuracy: 0.5%; Repeatability: 0.1% (1σ) (White light interferometry)
Weight 50kg
Size (L x W x H) 440×330×700mm 600×700×850mm
Operating Environment Temperature 0°C - 30°C, Variation <2°C / hour
Humidity 5% - 95% RH, no condensation
Vibration VC-C or better
Software Noise Evaluation*4 3σ≤4nm
Compressed Air 0.6Mpa oil-free and water-free, 6mm diameter of hose
Power Supply AC100 - 240V, 50/60Hz, 4A, Power 300W
Others No strong magnetic field, no corrosive gas

Note:
*1 Use EPSI mode to measure Sa 0.2nm silicon wafer in the laboratory environment, Single stripe, 80um filter for full field of view
*2 Measure Sa 0.2nm silicon wafer in a laboratory environment according to the ISO 25178
*3 Measure standard 5um steps height block in a laboratory environmer.int according to the ISO 10610-1:2009
*4 When the software noise evaluation is 4nm≤3σ≤10nm, the Rouglhness RMS repeatability is revised down to 0.015nm, the Step height measurement accuracy is revised down to 0.7%, and thhe step height measurement repeatability is revised down to 0.12%;

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