Stylus Nano Profiler NS200

Description

 
Stylus Nano Profiler NS200 is an ultra-precision contact measuring instrument for measurement of surface roughness and microscopic profile, such as micro-nano step height, film thickness.The NS200 uses a displacement sensor with sub-angstrom resolution, ultra-low noise signal acquisition, ultra-fine motion control, and calibration algorithms technology with excellent performance. Its contact force is extremely small, and there are no special requirements for measuring surface reflection characteristics, material types, and material hardness, consequently, it is widely used to measure microscopic surface for industries of semiconductors and compound semiconductors, high-brightness LEDs, solar energy, MEMS micro-electromechanical systems, touch screens, automotive and medical equipment.

details

Application

semicodnuctor-large-substrate-Glass-substrate-and-display-film-on-flexible-component
Semiconductor
● Step height of deposited film
● Step height of thin Film Resist
● Etch rate measurement
●Chemico-mechanical polishing (corrosion, pitting, bending)
Large Substrate
● PCB protrusion, step height
● Window coating
● Wafer mask
● Wafer chuck coating
● polishing plate
Glass substrate and display
● AMOLED
● Step height measurement during LCD screen development
● Thickness measurement for touch panel film Solar Coating Thin Film Measurements
Film on flexible component
● Organic photodetector
● Organic films printed on film and glass Touch screen copper traces

 

Parameters

 

Model No. NS200 NS200-D
Sample Observation Front View Navigation 5MP Colorful Camera F.O.V. : 2.2x1.7mm 5MP Colorful Camera F.O.V. : 10x13.4mm
Side View Navigation / 5MP Colorful Camera F.O.V. : 2x2.68mm
Sensor Ultra Low Inertia, LVDC Sensor
Measuring Force 1-50mg Adjustable
Stylus Tip radius 2μm , angle 60°
XY Travel Range Motorized X/Y(150mm×150mm), manually adjustable leveling
Sample R-θ Stage Motorized, 0~360°, continuous rotation
Vacuum Chuck 6-inch vacuum chuck
Single Scan Length 55mm
Max Scanning Range 150(XY travel) + 55mm scanning range, max range is 8 inches
Max Sample Height 50mm
Max Wafer Size 200mm(8”)
Step Height Repeatability*1 5 Å @ Range 330μm/ 10 Å @ Range 1mm (Measure step height 1μm, 1δ)
Sensor Range*2 330μm or 1050μm
Scanning Speed 2μm/s~10mm/s
Max Scan Sampling Points 12000
Size(L×W×H) 640×610×500mm 640x650x530mm
Weight 40kg
Input AC100~240V, 50/60 Hz, 200W
Working environment Humidity: 30~40% RH(No condensation), Temp.: 16~25°C(Fluctuation < 2°C/h), Ground vibration: 6.35μm /s(1~ 100Hz), Audio noise: ≤80dB, Air laminar flow: ≤ 0.508 m/s(Downward flow)

Note:
*1 Repeatability data was measured in a laboratory environment that meets VC-C standards and it is equipped with an anti-
vibration table. If these conditions are not met, the repeatability data will be doubled.
*2 The sensor range can only be selected between 330μm and 1050μm. Currently, only the 330μm range probe is a magnetic .
If there are no features requiring an ultra-large range probe, it is recommended to use the 330μm one.

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